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Scope -- Submissions -- Key Dates -- Additional Information -- Committee

Scope

The IEEE Latin-American Test Symposium (LATS, previously Latin-American Test Workshop - LATW) is a recognized forum for test and fault tolerance professionals and technologists from all over the world, in particular from Latin America, to present and discuss various aspects of system, board, and component testing and fault-tolerance with design, manufacturing and ﬁeld considerations in mind. Presented papers are also published in the IEEE Xplore Digital Library. The best papers of the 16th LATS will be invited to re-submit to the IEEE Design and Test of Computers, IEEE Transactions on Computer-Aided Design, Journal of Electronic Testing: Theory and Applications -JETTA (Springer) and Journal of Low Power Electronics - JOLPE (American Scientiﬁc Publishers).

You are invited to participate and submit your contributions to the LATS2015. Topics of interest include but are not limited to:

Analog Mixed Signal Test
Economics of Test
Memory Test and Repair
Automatic Test Generation Fault Analysis and Diagnosis
On-Line Testing
Built-In Self-Test
Fault Modeling and Simulation
Process Control and Measurements
Defect-Based Test - Fault-Tolerance in HW/SW
Radiation/EMI
Design and Synthesis for Testability
Fault-Tolerant Architectures
Software Fault-Tolerance
Design for Electromagnetic Compatibility
Hardware Trust & Security Approaches
Software On-Line Testing
Design for Reliable Embedded Software
HW-SW Integrity Checking- System-on-Chip Test
Design Veriﬁcation/Validation to Prevent Attacks
Yield Optimization

Submissions

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To encourage and facilitate discussions, participation will be limited. Those interested in presenting recent results at the symposium are invited to submit an extended abstract, one to three pages long, or a full length paper.

PDF electronic submissions should be done via the symposium webpage: www.latS.tttc-events.org. Authors should send papers in the IEEE format. Detailed instructions are available at the symposium webpage. The Program Committee also welcomes proposals for panels and special topic sessions.

Key Dates

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Submission Deadline: November 14th , 2014.

Notiﬁcation of Acceptance: December 19th, 2014.

Camera Ready: January 16th, 2015.

Additional Information

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For additional information, please contact one of the Program Chairs:

Leticia Maria Bolzani Poehls – Catholic University of Rio Grande do Sul (PUCRS), Brazil

leticia@poehls.com

Vishwani Agrawal – Auburn University, United States of America

vagrawal@eng.auburn.edu

Committee

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General Chairs

Victor Champac – INAOE, Mexico (champac@inaoep.mx)
Yervant Zorian – SYNOPSYS, USA (yervant.zorian@synopsys.com)

Program Chairs

Leticia Bolzani Poehls PUCRS, Brazil
Vishwani Agrawal Auburn University, USA

Past General Chair:

Fabian Vargas PUCRS, Brazil

Local Chairs:

José Ernesto Rayas Sánchez – ITESO, Mexico
Jose Garcia Gervacio – Univ. of Veracruz, Mexico

Publication Chair:

Maksim Jenihhin – Tallinn Tech. Univ., Estonia

Panel Chairs:

Ramesh Karri – New York University, USA
Fernanda Kastensmidt – UFRGS, Brazil

Publicity Chairs:

Ricardo Reis – UFRGS, Brazil
Giorgio di Natale – LIRMM, France
Hector Villacorta – INAOE, Mexico

Industry Liaison:

Federico Lobato – Freescale, Mexico

Asia Liaison:

Hiroyuki Yamauchi – Fukuoka Inst. of Tech., Japan

East-Europe Liaison:

Raimund Ubar – Tallinn Technical Univ., Estonia

West-Europe Liaison:

Said Hamdioui – Delft University, The Netherlands

North-America Liaison:

Swarup Bhunia – Case Western Reserve Univ., USA Magdy Abadir, USA

JETTA Liaison:

Vishwani D. Agrawal – Auburn University, USA

JOLPE Liaison:

Patrick Girard – LIRMM, France

TTEP Tutorials Chair:

Dimitris Gizopoulos University of Athens, Greece

TTTC PhD Thesis Contest Organizer:

José Lipovetzky – UBA, Argentina

Technical Program Committee:

Alex Orailoglu UCSD, USA
Andréa Weber UFPR, Brazil
Andreas Veneris University of Toronto, Canada
Avelino Zorzo – PUCRS, Brazil
Carlos Silva Cardenas – Catholic Univ. of Peru, Peru
Celia Lopez Ongil – UC3M, Spain
Dhiraj Pradhan – Univ. of Bristol, United Kingdom
Djones Lettnin – UFSC, Brazil
Emmanuel Simeu TIMA, France
Erik Jan Marinissen IMEC, Belgium
Frank Sill – UFMG, Brazil
Hans Joachim Wunderlich U. of Stuttgart, Germany
Jacob Abraham Univ. of Texas, USA
João Paulo Teixeira INESC ID / IST, Portugal
John P. Hayes – Univ. of Michigan, USA
Heinrich Vierhaus – BTU Cottbus, Germany
Jesus Moreno, ITESM, Mexico
José Pineda de Gyvez – NXP, The Netherlands
Julio Perez – UROU, Uruguay
Kaushik Roy, Purdue University, USA
Luz Suarez Balado – UPC, Spain
Mani Soma – Univ. Washington, USA
Marcelino Santos INESC, Portugal
Marta Portela Garcia Univ. Carlos III, Spain
Michel Renovell - LIRMM, France
Mohammad Tehranipoor – U. of Connecticut, USA
Ozgur Sinanoglu New York Univ., United Arab Emirates
Regis Leveugle, TIMA, France
Roberto Gomez, Univ. of Sonora, Mexico
Sachin Sapatnekar – Univ. of Minnesota, USA
Sybille Hellebrand – Univ. of Paderborn, Germany
Taisy Silva Weber – UFRGS, Brazil
Victor Avendaño - Freescale, Mexico
Wang J. Chau – LME / USP, Brazil
Xiaoqing Wen - Kyushu Inst. of Technology, Japan

Steering Committee:

Victor Champac
Fabian Vargas
Marcelo Lubaszewski
Raoul Velazco
Yervant Zorian

For more information, visit us on the web at: http://www.latS.tttc-events.org

The 16th IEEE Latin-American Test Symposium is sponsored by the Institute of Electrical and Electronics Engineers (IEEE) Computer Society's Test Technology Technical Council (TTTC).